Moisture Ingress and Pin-to-Pin Leakage Current: The Microamp Failure Mode That Corrupts High-Impedance Analog Inputs
In March of last year, a BMS test bench in an unconditioned Detroit lab produced a 180 mV offset on channel 4 between 10 p.m. and 6 a.m. The daytime readings were within 1.2 mV of the reference. The engineer had already reflashed firmware twice and swapped the ADC before I pulled the harness apart […]